Demonstration Environment - development

Dataset

Surface analysis and depth profiling of photovoltaic devices

University of South Australia
Dr John Denman (Managed by)
Viewed: [[ro.stat.viewed]] Cited: [[ro.stat.cited]] Accessed: [[ro.stat.accessed]]
ctx_ver=Z39.88-2004&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Adc&rfr_id=info%3Asid%2FANDS&rft.title=Surface analysis and depth profiling of photovoltaic devices&rft.publisher=University of South Australia&rft.description=Depth profiling of polymer photovoltaic devices was performed. Sputter rates for standards of PCBM and P3HT layers were established to allow investigations of mixed PCBM and P3HT layers and interfaces.&rft.creator=Anonymous&rft.date=2011&rft_subject=Colloid and Surface Chemistry&rft_subject=Physical Chemistry (incl. Structural)&rft_subject=Chemical Sciences&rft_subject=Physical Chemistry of Materials&rft_subject=Macromolecular and Materials Chemistry&rft_subject=Chemical Characterisation of Materials&rft_subject=0301010&rft_subject=Condensed Matter Modelling and Density Functional Theory&rft_subject=Condensed Matter Physics&rft_subject=Physical Sciences&rft_subject=Condensed Matter Characterisation Technique Development&rft_subject=Surfaces and Structural Properties of Condensed Matter&rft_subject=To F-SIMS &rft_subject=Depth Profile&rft_subject=P3ht&rft_subject=Pcbm&rft_subject=Photovoltaic Device&rft.type=dataset&rft.language=English Go to Data Provider

Please use the contact information below to request access to this data.

Access:

Other view details

Conditions of use:
The User acknowledges that the Product was developed by the Ian Wark Research Institute for its own research purposes. The Ian Wark Research Institute will not therefore be liable for interpretation of or inconsistencies, discrepancies, errors or omissions in any or all of the Product as supplied.
Any use of or reliance by the User on the Product or any part thereof is at the User's own risk and the Ian Wark Research Institute shall not be liable for any loss or damage howsoever arising as a result of such use.
The User agrees that whenever the Product or imagery/data derived from the Product are published by the User, the Ian Wark Research Institute shall be acknowledged as the source of the Product.
The User agrees to indemnify and hold harmless the Ian Wark Research Institute in respect of any loss or damage (including any rights arising from negligence or infringement of third party intellectual property rights) suffered by the Ian Wark Research Institute as a result of User's use of or reliance on the Data.

Contact Information

john.denman@unisa.edu.au

School of Mathematical and Physical Sciences University Drive Callaghan NSW 2308 Australia

Brief description

Depth profiling of polymer photovoltaic devices was performed. Sputter rates for standards of PCBM and P3HT layers were established to allow investigations of mixed PCBM and P3HT layers and interfaces.